- All sections
- G - Physics
- G01R - Measuring electric variables; measuring magnetic variables
- G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences
Patent holdings for IPC class G01R 31/3183
Total number of patents in this class: 721
10-year publication summary
|
45
|
49
|
38
|
62
|
68
|
70
|
58
|
83
|
63
|
17
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1939 |
67 |
| Texas Instruments Incorporated | 19376 |
60 |
| Siemens Industry Software Inc. | 1633 |
43 |
| International Business Machines Corporation | 60644 |
34 |
| Synopsys, Inc. | 2829 |
29 |
| Cadence Design Systems, Inc. | 1788 |
22 |
| Intel Corporation | 45621 |
19 |
| Teradyne, Inc. | 579 |
17 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
15 |
| Kyushu Institute of Technology | 319 |
14 |
| Tektronix, Inc. | 636 |
14 |
| Samsung Electronics Co., Ltd. | 131630 |
12 |
| Xilinx, Inc. | 4086 |
9 |
| Qualcomm Incorporated | 76576 |
8 |
| Huawei Technologies Co., Ltd. | 100781 |
7 |
| Imagination Technologies Limited | 1458 |
7 |
| ROHDE & Schwarz GmbH & Co. KG | 1831 |
7 |
| Renesas Electronics Corporation | 6305 |
6 |
| Realtek Semiconductor Corp. | 3028 |
6 |
| LitePoint Corporation | 208 |
6 |
| Other owners | 319 |